JAL Group to Participate in 'e-Passport Tests'

Travel News Asia 14 January 2005

The JAL Group is to participate in e-Passport Tests containing passengers biometric data in cooperation with relevant Japanese ministries from February 2005 to March 2005.

The Japanese Ministry of Land, Infrastructure and Transport (MLIT) and the JAL Group will carry out tests of secure and smooth flight airport procedures at New Tokyo International Airport in Narita.

Participants will be able to experience smooth check-in and immigration control procedures in an upgraded version of e-check-in tests that took place last year. In the latest tests, passengers taking part will be issued with a SPT Card (SPT = simplifying passenger travel) embedded with an IC (integrated circuit) chip containing the holders biometric data to use at verification machines for check-in, security checks and immigration control, thus shortening the time waiting in queues.

JAL will also participate in tests using experimental IC bio-passports containing the holders facial image that will be issued by the Ministry of Foreign Affairs for use by diplomatic passport holders.

Participants for the tests will be selected from JAL Global Club members and JAL Mileage Bank members. The targeted number of participants is around 500. The tests will evaluate the practical use of biometrics, i.e. facial, iris and fingerprint authentication technology for check-in, security checks and immigration control.

See other recent news regarding: JAL, Biometrics

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