The Transportation Security Administration
(TSA), working collaboratively with American Airlines, is
demonstrating a new computed tomography (CT) scanner at the
Terminal 8 security checkpoint of New York’s John F. Kennedy
International Airport (JFK).
Because CT technology is three
dimensional (3-D), this new checkpoint technology has the
potential to provide better visibility and allow the operator to
rotate the bag’s image 360 degrees to show the contents of
carry-on items from every angle.
CT provides the capability to
virtually see beyond unwanted clutter and greatly enhances the
ability to visually inspect the contents of carry-on bags for
explosives and other prohibited items.
“Use of CT technology substantially improves
TSA's threat detection capability at a checkpoint.” said TSA
Administrator, David Pekoske. “This partnership will allow us to
deploy new technology quickly and see an immediate improvement in
The TSA expects the new CT technology from
analogic to begin
operation at JFK in late July. CT technology is also being tested
at airport security checkpoints in Phoenix and Boston.
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