New Screening Technology Being Tested at New York’s JFK International Airport

The Transportation Security Administration (TSA), working collaboratively with American Airlines, is demonstrating a new computed tomography (CT) scanner at the Terminal 8 security checkpoint of New York’s John F. Kennedy International Airport (JFK).

Because CT technology is three dimensional (3-D), this new checkpoint technology has the potential to provide better visibility and allow the operator to rotate the bag’s image 360 degrees to show the contents of carry-on items from every angle.

CT provides the capability to virtually see beyond unwanted clutter and greatly enhances the ability to visually inspect the contents of carry-on bags for explosives and other prohibited items.

“Use of CT technology substantially improves TSA's threat detection capability at a checkpoint.” said TSA Administrator, David Pekoske. “This partnership will allow us to deploy new technology quickly and see an immediate improvement in security effectiveness.”

The TSA expects the new CT technology from analogic to begin operation at JFK in late July. CT technology is also being tested at airport security checkpoints in Phoenix and Boston.

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